ARP’s Terahertz Spectrometer, TeraSpectra is a turn key spectrometer system, that allows time domain measurements to be conducted over a time span of sub-Pico seconds to a few tens of Pico-seconds with an equivalent frequency range of 0.1 to ~30 THz.
This wide range allows characterizing a number of molecular events important in semiconductor and nano-material research and inspection.
| Parameter | TeraSpectra |
|
| Time resolution | ~33 Femto-seconds | |
| Time span | Up to 100 Pico-seconds | |
| Fourier Transform Frequency Range | 0.1 up to ~35 terahertz | |
| Technology | Next generation EO dendrimer terahertz emitter |
|
| Source power | >5 milliwatts, average | |
| Sensitivity | ~100 FemtoMol |
Key Features
- Turn-key System
- 3-Dimensional Imaging
- Sub-Surface Inspection
- Non-Contact
- Non-Destructive
- Layer-by-Layer Analysis
- Material Characterization:
- Lattice Image
- Stacking Fault
- Dislocations
- Nanovoids
- Delamination