Technical Publications

The following papers are based on real application of the TNS3DI instrument system, focused on Semiconductors and Nanometrology

  1. Nanoscale Metrology of Line Patterns on Semiconductor by Continuous Wave Terahertz Multispectral Reconstructive 3-D Imaging Overcoming the Abbe Diffraction Limit. IEEE T-SM
  2. Sub-surface nanometrology of semiconductor wafers and graphene quality assessment via terahertz route
  3. Effective testing for wafer reject minimization by terahertz analysis and sub-surface imaging, ASMC 2014
  4. A to Z of a terahertz spectroscopy  and sub-surface imaging experiment – September 2016
  5. Advances in Terahertz Spectroscopy Nanoscanner and Sub-surface 3D Imaging for Biomaterial Anis – September 2016
  6. Dendrimer based terahertz time-domain spectroscopy and applications in molecular characterization – July 2011
  7. Deformation kinetics of layered personal protective material under impact via terahertz reflectometry – April 2016
  8. Dendrimer Dipole Excitation: A New Mechanism for Terahertz Generation – Journal of Biosensors & Bioelectronics – 2016
  9. Terahertz Spectroscopic Analysis and Multispectral Imaging of Epitaxially Grown Semiconductors with Nanometer Resolution – Journal of Biosensor & Bioelectronics – 2016
  10. Investigation of high voltage induced damage of GaN grown on Si substrate by terahertz nano-imaging and spectroscopy. – Applied Research & Photonics, Inc. – May 18, 2017
  11. Interaction of Sensitizing Dyes with Nanostructured TiO2 Film in Dye-Sensitized Solar Cells Using Terahertz Spectroscopy – July 22, 2016 – Scientific Reports.
  12. Terahertz Sub-Nanometer Sub-Surface Imaging of 2D Materials – 2016 – Journal of Biosensors & Bioelectronics.
  13. Investigation of self-assembled monolayers on silicon wafer  by terahertz spectrometry – Applied Research & Photonics, Inc.