The following papers are based on real application of the TNS3DI instrument system, focused on Semiconductors and Nanometrology
- Nanoscale Metrology of Line Patterns on Semiconductor by Continuous Wave Terahertz Multispectral Reconstructive 3-D Imaging Overcoming the Abbe Diffraction Limit. IEEE T-SM
- Sub-surface nanometrology of semiconductor wafers and graphene quality assessment via terahertz route
- Effective testing for wafer reject minimization by terahertz analysis and sub-surface imaging, ASMC 2014
- A to Z of a terahertz spectroscopy and sub-surface imaging experiment – September 2016
- Advances in Terahertz Spectroscopy Nanoscanner and Sub-surface 3D Imaging for Biomaterial Anis – September 2016
- Dendrimer based terahertz time-domain spectroscopy and applications in molecular characterization – July 2011
- Deformation kinetics of layered personal protective material under impact via terahertz reflectometry – April 2016
- Dendrimer Dipole Excitation: A New Mechanism for Terahertz Generation – Journal of Biosensors & Bioelectronics – 2016
- Terahertz Spectroscopic Analysis and Multispectral Imaging of Epitaxially Grown Semiconductors with Nanometer Resolution – Journal of Biosensor & Bioelectronics – 2016
- Investigation of high voltage induced damage of GaN grown on Si substrate by terahertz nano-imaging and spectroscopy. – Applied Research & Photonics, Inc. – May 18, 2017
- Interaction of Sensitizing Dyes with Nanostructured TiO2 Film in Dye-Sensitized Solar Cells Using Terahertz Spectroscopy – July 22, 2016 – Scientific Reports.
- Terahertz Sub-Nanometer Sub-Surface Imaging of 2D Materials – 2016 – Journal of Biosensors & Bioelectronics.
- Investigation of self-assembled monolayers on silicon wafer by terahertz spectrometry – Applied Research & Photonics, Inc.