Applied Research & Photonics, Inc. (ARP) provides terahertz nano-scanning material characterization testing services and technology to semiconductor and nano-material researchers and manufacturers. Their TeraSpectra Spectrometer is a sub-surface nano-scanner and 3D imager that provide non-contact, non-destructive testing capabilities at ambient temperatures. There award winning revolutionary technology has two key innovations:
- it breaks the spatial resolution limit of current generation optical inspection technologies, and
- it uniquely identifies location and depth where defects exist.
ARP technology has received the prestigious CLEO/LFW innovation award and NASA TechBrief’s nano-50 award. ARP inventions have earned multiple patents (awarded and pending).